MICROSPECTROSCOPIC REFLECTANCE MEASUREMENTS OF TEXTURED POLYCRYSTALLINE SI SOLAR-CELLS BY SCANNING SPECTROREFLECTOMETER

This is the first observation of the microspectroscopic hemispherical reflectances of polycrystalline Si solar cells by the newly-developed scanning spectroreflectometer that represents the surface texturing of small-sized grains. After studying the reflectivity of textured grains with various crystal faces, we found that textured near-(100) grains had lower reflectivity than the other oriented textured grains where the "near" meant crystal faces within the deviation of 15-20 degrees from the defined low index faces. In addition, we proved that if the reflectances of grains are indirectly obtained from the unmetallized dummy wafers, the internal quantum efficiencies of grains are not correctly estimated.