NEW AUTOMATIC TRIPLE-CRYSTAL X-RAY DIFFRACTOMETER FOR PRECISION-MEASUREMENT OF INTENSITY DISTRIBUTION OF BRAGG-DIFFRACTION AND HUANG SCATTERING

被引:20
作者
PICK, MA [1 ]
BICKMANN, K [1 ]
POFAHL, E [1 ]
ZWOLL, K [1 ]
WENZL, H [1 ]
机构
[1] KFA JULICH GMBH,INST FESTKORPERFORSCH,D-5170 JULICH 1,FED REP GER
关键词
D O I
10.1107/S0021889877013958
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:450 / 457
页数:8
相关论文
共 20 条
[1]   GROWTH STRIAE IN SINGLE-CRYSTALS OF GADOLINIUM GALLIUM GARNET [J].
BELT, RF ;
MOSS, JP .
MATERIALS RESEARCH BULLETIN, 1973, 8 (10) :1197-1204
[2]   PRECISION LATTICE CONSTANT DETERMINATION [J].
BOND, WL .
ACTA CRYSTALLOGRAPHICA, 1960, 13 (10) :814-818
[3]   RONTGENOGRAPHISCHE ABBILDUNG DES VERZERRUNGSFELDES EINZELNER VERSETZUNGEN IN GERMANIUM-EINKRISTALLEN [J].
BONSE, U ;
KAPPLER, E .
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1958, 13 (04) :348-&
[4]   EIN RONTGENOGRAPHISCHES VERFAHREN ZUR MESSUNG DER VERTEILUNGSKURVE DER GITTERKONSTANTEN + NETZEBENENORIENTIERUNGEN AN EINKRISTALLEN [J].
BONSE, U ;
KAPPLER, E ;
SCHILL, A .
ZEITSCHRIFT FUR PHYSIK, 1964, 178 (03) :221-&
[5]  
Dukes J. N., 1970, Hewlett-Packard Journal, V21, P2
[6]  
EISENBERGER P, 1972, PHYS REV LETT, V22, P1519
[8]   X-RAY TOPOGRAPHIC ANALYSIS OF DISLOCATIONS AND GROWTH BANDS IN A MELT GROWN GADOLINIUM GALLIUM GARNET CRYSTAL [J].
GLASS, HL .
MATERIALS RESEARCH BULLETIN, 1973, 8 (01) :43-52
[9]   APPLICATION OF X-RAY TRIPLE-CRYSTAL SPECTROMETER FOR MEASURING RADIUS OF CURVATURE OF BENT SINGLE-CRYSTALS [J].
GODWOD, K ;
NAGY, AT ;
REK, Z .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1976, 34 (02) :705-710
[10]   MULTIPLE CRYSTAL SYSTEM FOR HIGH STRAIN SENSITIVITY X-RAY TOPOGRAPHY AND ITS APPLICATIONS [J].
HASHIZUME, H ;
IIDA, A ;
KOHRA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1975, 14 (10) :1433-1441