MULTILAYER FACILITIES REQUIRED FOR EXTREME-ULTRAVIOLET LITHOGRAPHY

被引:61
作者
WINDT, DL
WASKIEWICZ, WK
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 06期
关键词
D O I
10.1116/1.587449
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:3826 / 3832
页数:7
相关论文
共 8 条
[1]   REPAIR OF SOFT-X-RAY OPTICAL-ELEMENTS BY STRIPPING AND REDEPOSITION OF MO/SI REFLECTIVE COATINGS [J].
EARLY, K ;
WINDT, DL ;
WASKIEWICZ, WK ;
WOOD, OR ;
TENNANT, DM .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1993, 11 (06) :2926-2929
[2]  
FREEMAN RR, 1991, AT T TECH J NOV, P37
[3]   MASKED DEPOSITION TECHNIQUES FOR ACHIEVING MULTILAYER PERIOD VARIATIONS REQUIRED FOR SHORT-WAVELENGTH (68-ANGSTROM) SOFT-X-RAY IMAGING OPTICS [J].
KORTRIGHT, JB ;
GULLIKSON, EM ;
DENHAM, PE .
APPLIED OPTICS, 1993, 32 (34) :6961-6968
[4]   SOFT-X-RAY PROJECTION IMAGING WITH A 1/1 RING-FIELD OPTIC [J].
MACDOWELL, AA ;
BJORKHOLM, JE ;
EARLY, K ;
FREEMAN, RR ;
HIMEL, MD ;
MULGREW, PP ;
SZETO, LH ;
TAYLOR, DW ;
TENNANT, DM ;
WOOD, OR ;
BOKOR, J ;
EICHNER, L ;
JEWELL, TE ;
WASKIEWICZ, WK ;
WHITE, DL ;
WINDT, DL ;
DSOUZA, RM ;
SILFVAST, WT ;
ZERNIKE, F .
APPLIED OPTICS, 1993, 32 (34) :7072-7078
[5]   SOFT-X-RAY PROJECTION LITHOGRAPHY EXPERIMENTS USING SCHWARZSCHILD IMAGING OPTICS [J].
TICHENOR, DA ;
KUBIAK, GD ;
MALINOWSKI, ME ;
STULEN, RH ;
HANEY, SJ ;
BERGER, KW ;
BROWN, LA ;
SWEATT, WC ;
BJORKHOLM, JE ;
FREEMAN, RR ;
HIMEL, MD ;
MACDOWELL, AA ;
TENNANT, DM ;
WOOD, OR ;
BOKOR, J ;
JEWELL, TE ;
MANSFIELD, WM ;
WASKIEWICZ, WK ;
WHITE, DL ;
WINDT, DL .
APPLIED OPTICS, 1993, 32 (34) :7068-7071
[6]  
WASKIEWICZ WK, 1991, OSA PROC, V12, P97
[7]  
Windt D. L., 1991, P SOC PHOTO-OPT INS, V1547, P144
[8]   INTERFACE IMPERFECTIONS IN METAL/SI MULTILAYERS [J].
WINDT, DL ;
HULL, R ;
WASKIEWICZ, WK .
JOURNAL OF APPLIED PHYSICS, 1992, 71 (06) :2675-2678