FACTOR-ANALYSIS OF AES DEPTH PROFILES ON SI3N4 CERAMIC POWDERS

[1] ATZRODT V, 1984, PHYS STATUS SOLIDI A, V82, P373, DOI 10.1002/pssa.2210820205

[2] PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : 489 - 496

[3] BESHENKOV VG, 1988, PYOVERKHNOST, P139

[4] ELECTRON AND ION-BEAM DEGRADATION EFFECTS IN AES ANALYSIS OF SILICON-NITRIDE THIN-FILMS [J]. SURFACE AND INTERFACE ANALYSIS, 1985, 7 (02) : 79 - 87

[5] PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 7 - 18

[6] APPLICATION OF AUGER LINE-SHAPES AND FACTOR-ANALYSIS TO CHARACTERIZE A METAL-CERAMIC INTERFACIAL REACTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 458 - 461

[7] APPLICATION OF FACTOR-ANALYSIS TO ELEMENTAL DETECTION LIMITS IN SPUTTER DEPTH PROFILING [J]. APPLIED SURFACE SCIENCE, 1986, 26 (04) : 561 - 574

[8] CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 600 - 604

[9] HUGUS ZZ, 1971, J PHYS CHEM-US, V75, P2954

[10] COMPARATIVE SURFACE AND BULK ANALYSIS OF OXYGEN IN SI3N4 POWDERS [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (4-5): : 502 - 506

[1] ATZRODT V, 1984, PHYS STATUS SOLIDI A, V82, P373, DOI 10.1002/pssa.2210820205

[2] PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : 489 - 496

[3] BESHENKOV VG, 1988, PYOVERKHNOST, P139

[4] ELECTRON AND ION-BEAM DEGRADATION EFFECTS IN AES ANALYSIS OF SILICON-NITRIDE THIN-FILMS [J]. SURFACE AND INTERFACE ANALYSIS, 1985, 7 (02) : 79 - 87

[5] PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 7 - 18

[6] APPLICATION OF AUGER LINE-SHAPES AND FACTOR-ANALYSIS TO CHARACTERIZE A METAL-CERAMIC INTERFACIAL REACTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 458 - 461

[7] APPLICATION OF FACTOR-ANALYSIS TO ELEMENTAL DETECTION LIMITS IN SPUTTER DEPTH PROFILING [J]. APPLIED SURFACE SCIENCE, 1986, 26 (04) : 561 - 574

[8] CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 600 - 604

[9] HUGUS ZZ, 1971, J PHYS CHEM-US, V75, P2954

[10] COMPARATIVE SURFACE AND BULK ANALYSIS OF OXYGEN IN SI3N4 POWDERS [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (4-5): : 502 - 506