BILOW - SIMULATION OF LOW-TEMPERATURE BIPOLAR DEVICE BEHAVIOR

被引：34

作者：

CHRZANOWSKAJESKE, M ^{[1
]}

JAEGER, RC ^{[1
]}

机构：

[1] AUBURN UNIV,ALABAMA MICROELECTR SCI & TECHNOL CTR,AUBURN,AL 36849

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1989年 / 36卷 / 08期

关键词：

D O I：

10.1109/16.30961

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1475 / 1488

页数：14

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