STUDY OF STRUCTURAL-CHANGES OF TELLURIUM THIN-FILMS ON POLYMER SUBSTRATES BY ELECTRICAL MEASUREMENTS AND TRANSMISSION ELECTRON-MICROSCOPY

被引：6

作者：

HOFFMANN, T

FIEDLER, B

KLUCK, T

PETERMANN, J

MARTINEZSALAZAR, J

机构：

[1] TECH UNIV HAMBURG,ARBEITSBEREICH POLYMERE VERBUNDWERKSTOFFE,D-21073 HAMBURG,GERMANY

[2] TECH UNIV HAMBURG,ARBEITSBEREICH TECH KERAM,D-21073 HAMBURG,GERMANY

[3] UNIV DORTMUND,FACHBEREICH CHEM TECH,LEHRSTUHL WERKSTOFFKUNDE,D-44221 DORTMUND,GERMANY

来源：

THIN SOLID FILMS | 1994年 / 245卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(94)90909-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In-situ electrical measurements and transmission electron microscopy observations of tellurium ultrathin films evaporated onto poly(1-butene) substrates have been correlated. A surprising increase of the current through the deposits of 1-2 orders of magnitude directly after deposition were found. In a system with constant mass we consider that structural changes in the deposit are responsible for this behaviour. Micrographs of the structure of the deposit support this idea by providing evidence of mutual coalescence. A further increase of the current by 1-2 orders of magnitude in 2 h can be explained by a continuous crystallization of the initially amorphous tellurium layer.

引用

页码：272 / 276

页数：5

共 17 条

[1] MICROSTRUCTURE OF TELLURIUM-FILMS [J].