STRUCTURE OF THE GROWTH INTERFACE OF Y-BA-CU-O ANALOGS ON SRTIO3 (001) SUBSTRATES

被引:6
作者
NAKANISHI, M
HASHIZUME, H
TERASHIMA, T
BANDO, Y
MICHIKAMI, O
MAEYAMA, S
OSHIMA, M
机构
[1] TOKYO INST TECHNOL, ENGN MAT RES LAB, MIDORI KU, YOKOHAMA, KANAGAWA 227, JAPAN
[2] NIPPON TELEGRAPH & TEL PUBL CORP, INTERDISCIPLINARY RES LAB, MUSASHINO, TOKYO 180, JAPAN
[3] KYOTO UNIV, INST CHEM RES, UJI, KYOTO 611, JAPAN
[4] NIPPON TELEGRAPH & TEL PUBL CORP, INTERDISCIPLINARY RES LAB, TOKAI, IBARAKI 31911, JAPAN
来源
PHYSICAL REVIEW B | 1993年 / 48卷 / 14期
关键词
D O I
10.1103/PhysRevB.48.10524
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The interface structures of c-axis-oriented ultrathin Gd-Ba-Cu-0 and Eu-Ba.Cu-O films on SrTiO3 (001) substrates have been determined using x-ray standing waves. Rare-earth fluorescence profiles observed near the 001 Bragg condition of SrTiO3 show a dip without a marked peak, which can only be explained by either a BaO layer interfacing the TiO2 plane of SrTiO3 or the CuO or CuO2 layer interfacing the SrO plane. Calculations of x-ray field intensities using a simple rigid-sphere-ion model show that for both Gd-Ba-Cu-O and Eu-Ba-Cu-O neither the CuO layer nor the CuO2 layer can be the first grown layer on the TiO2 surface of SrTiO3. Similarly, neither the BaO layer nor the rare-earth layer can be the first layer on the SrO surface.
引用
收藏
页码:10524 / 10529
页数:6
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