CHARACTERIZATION BY AUGER SPECTROMETRY AND ION SPUTTERING OF TYPES OF GROWTH AND INTERFACE IN AG-PD PAIR

被引：25

作者：

GUGLIELMACCI, JM

GILLET, M

机构：

来源：

THIN SOLID FILMS | 1980年 / 68卷 / 02期

关键词：

D O I：

10.1016/0040-6090(80)90272-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：407 / 416

页数：10

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