ELECTRON TUNNEL SENSORS

被引:11
作者
KENNY, TW
KAISER, WJ
REYNOLDS, JK
PODOSEK, JA
ROCKSTAD, HK
VOTE, EC
WALTMAN, SB
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1992年 / 10卷 / 04期
关键词
D O I
10.1116/1.577991
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have used the extreme sensitivity of electron tunneling to variations in electrode separation to construct a novel, compact displacement transducer. Electrostatic forces are used to control the separation between the tunneling electrodes, thereby eliminating the need for piezoelectric actuators. The entire structure is composed of micromachined silicon single crystals. Applications of the tunneling displacement transducer to the measurement of acceleration and infrared signals are discussed. Measurements of acceleration and infrared sensitivity are reported.
引用
收藏
页码:2114 / 2118
页数:5
相关论文
共 28 条
[1]   NOISE-REDUCTION TECHNIQUE FOR SCANNING TUNNELING MICROSCOPY [J].
ABRAHAM, DW ;
WILLIAMS, CC ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1988, 53 (16) :1503-1505
[2]   MICROFABRICATED SCANNING TUNNELING MICROSCOPE [J].
AKAMINE, S ;
ALBRECHT, TR ;
ZDEBLICK, MJ ;
QUATE, CF .
IEEE ELECTRON DEVICE LETTERS, 1989, 10 (11) :490-492
[3]   ACCELEROMETER SYSTEMS WITH SELF-TESTABLE FEATURES [J].
ALLEN, HV ;
TERRY, SC ;
DEBRUIN, DW .
SENSORS AND ACTUATORS, 1989, 20 (1-2) :153-161
[4]   TUNNELLING ACCELEROMETER [J].
BASKI, AA ;
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :73-76
[5]  
BINNIG G, 1986, IBM J RES DEV, V30, P355
[6]   VACUUM TUNNELING PROBE - A NONRECIPROCAL, REDUCED-BACK-ACTION TRANSDUCER [J].
BOCKO, MF ;
STEPHENSON, KA ;
KOCH, RH .
PHYSICAL REVIEW LETTERS, 1988, 61 (06) :726-729
[7]   A FIBEROPTIC INTERFEROMETRIC SEISMOMETER [J].
GARDNER, DL ;
HOFLER, T ;
BAKER, SR ;
YARBER, RK ;
GARRETT, SL .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1987, 5 (07) :953-960
[10]   REFLECTION AND TRANSMISSION INTERFERENCE FILTERS [J].
HADLEY, LN ;
DENNISON, DM .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1947, 37 (06) :451-465