HIGHLY SENSITIVE MOIRE TECHNIQUE FOR DIRECT AND REAL-TIME OBSERVATION OF ELECTRON-MICROSCOPIC PHASE OBJECTS

被引：4

作者：

RU, Q

ENDO, J

TONOMURA, A

机构：

[1] Tonomura Electron Wavefront Project, Research Development Corporation of Japan, Hatoyama, Saitama 350-03

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 23期

关键词：

D O I：

10.1063/1.106841

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A Moire modulation which is a sine function of the phase variation of a phase object to be investigated in an interference electron microscope is proposed. When the phase variation is larger than 2-pi, the conventional cosine-functioned Moire-fringe pattern is observed, and when the phase variation is very less than 2-pi, phase-contrast Moire modulation which can never be achieved by the conventional Moire method is observed. The analogue and digital formations of this sine-functioned Moire modulation in a photographic film and video camera, respectively, are presented. Real-time observation is realized by the digital method.

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页码：2840 / 2842

页数：3

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