MAPPING OF MICROELECTRIC AND MAGNETIC-FIELDS WITH DOUBLE-EXPOSURE ELECTRON HOLOGRAPHY

被引：35

作者：

MATTEUCCI, G ^{[1
]}

MISSIROLI, GF ^{[1
]}

CHEN, JW ^{[1
]}

POZZI, G ^{[1
]}

机构：

[1] UNIV LECCE,CONSORZIO INTERUNIV STRUTTURA MAT,DEPT PHYS,I-73100 LECCE,ITALY

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 03期

关键词：

D O I：

10.1063/1.99511

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：176 / 178

页数：3

共 8 条

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[2] ELECTRON HOLOGRAPHIC OBSERVATIONS OF THE ELECTROSTATIC-FIELD ASSOCIATED WITH THIN REVERSE-BIASED P-N-JUNCTIONS [J].

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MATTEUCCI, G ;

POZZI, G ;

VANZI, M .

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[3]

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[4]

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[5] HOLOGRAPHIC INTERFEROMETRY [J].

HEFLINGER, LO ;

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[6]

MATTEUCCI G, 1984, IEEE T MAGN, V20, P1970

[7] ELECTRON HOLOGRAPHY TO IMAGE MAGNETIC DOMAINS [J].

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[8]

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