ENTHALPY OF VACANCY MIGRATION IN SI AND GE

被引:113
作者
VANVECHTEN, JA [1 ]
机构
[1] BELL TEL LABS, MURRAY HILL, NJ 07974 USA
关键词
D O I
10.1103/PhysRevB.10.1482
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:1482 / 1505
页数:24
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共 117 条
[51]   SELF-DIFFUSION IN GERMANIUM [J].
LETAW, H ;
PORTNOY, WM ;
SLIFKIN, L .
PHYSICAL REVIEW, 1956, 102 (03) :636-639
[52]  
Liebmann H., 1914, Z F R KRISTALLOGRAPH, V53, P171, DOI [10.1524/zkri.1914.53.1.171, DOI 10.1524/ZKRI.1914.53.1.171]
[53]  
LIEHR AD, 1963, J PHYS CHEM-US, V67, P471, DOI 10.1021/j100796a044
[55]   THERMALLY INDUCED ACCEPTORS IN GERMANIUM [J].
LOGAN, RA .
PHYSICAL REVIEW, 1956, 101 (05) :1455-1459
[56]   LOW-TEMPERATURE ANNEALING STUDIES IN GE [J].
MACKAY, JW ;
KLONTZ, EE .
JOURNAL OF APPLIED PHYSICS, 1959, 30 (08) :1269-1274
[57]   ELEASTIC PROPERTIES OF ZNS STRUCTURE SEMICONDUCTORS [J].
MARTIN, RM .
PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (10) :4005-+
[58]   SEMIVACANCY PAIR IN CRYSTALLINE SILICON [J].
MASTERS, BJ .
SOLID STATE COMMUNICATIONS, 1971, 9 (04) :283-&
[59]   MOLECULAR-ORBITAL TREATMENT FOR DEEP LEVELS IN SEMICONDUCTORS - SUBSTITUTIONAL NITROGEN AND LATTICE VACANCY IN DIAMOND [J].
MESSMER, RP ;
WATKINS, GD .
PHYSICAL REVIEW B, 1973, 7 (06) :2568-2590
[60]  
MOTT NF, 1964, ELECTRONIC PROCESSES