ELECTRONIC CHARACTERIZATION OF DOUBLE-GATE THIN-FILM TRANSISTORS

被引：5

作者：

CHEN, I

LUO, FC

机构：

来源：

SOLID-STATE ELECTRONICS | 1981年 / 24卷 / 03期

关键词：

D O I：

10.1016/0038-1101(81)90088-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：257 / 261

页数：5

相关论文

共 9 条

[1] THIN-FILM TRANSISTORS - PAST, PRESENT AND FUTURE
ANDERSON, JC
[J]. THIN SOLID FILMS, 1978, 50 (MAY) : 25 - 32
[2] THEORY OF FIELD EFFECT IN AMORPHOUS COVALENT SEMICONDUCTOR FILMS
BARBE, DF
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (01): : 102 - &
[3] INFLUENCE OF A FLATBAND-VOLTAGE VARIATION ALONG CHANNEL ON DRAIN CHARACTERISTICS OF A TFT
BURGELMAN, M
PAUWELS, HJ
[J]. SOLID-STATE ELECTRONICS, 1976, 19 (06) : 459 - 461
[4] CARNAHAN B, 1969, APPLIED NUMERICAL ME, pCH7
[5] INVESTIGATION OF DENSITY OF LOCALIZED STATES IN A-SI USING FIELD-EFFECT TECHNIQUE
MADAN, A
LECOMBER, PG
SPEAR, WE
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1976, 20 (02) : 239 - 257
[6] THEORY AND INTERPRETATION OF FIELD-EFFECT CONDUCTANCE EXPERIMENT IN AMORPHOUS SILICON
NEUDECK, GW
MALHOTRA, AK
[J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (06) : 2662 - 2669
[7] Spear W. E., 1972, Journal of Non-Crystalline Solids, V8-10, P727, DOI 10.1016/0022-3093(72)90220-7
[8] Tickle A. C., 1969, THIN FILM TRANSISTOR
[9] THEORETICAL INFLUENCE OF SURFACE STATES AND BULK TRAPS ON THIN-FILM TRANSISTOR CHARACTERISTICS
VANCALSTER, A
PAUWELS, HJ
[J]. SOLID-STATE ELECTRONICS, 1975, 18 (7-8) : 691 - 698