REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) OSCILLATIONS AT 77-K

被引：266

作者：

EGELHOFF, WF

JACOB, I

机构：

来源：

PHYSICAL REVIEW LETTERS | 1989年 / 62卷 / 08期

关键词：

D O I：

10.1103/PhysRevLett.62.921

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：921 / 924

页数：4

相关论文

共 74 条

[71] RED INTENSITY OSCILLATIONS DURING MBE OF GAAS
WOOD, CEC
[J]. SURFACE SCIENCE, 1981, 108 (02) : L441 - L443
[72] KINETICS OF THE FORMATION OF NORMAL AND INVERTED MOLECULAR-BEAM EPITAXIAL INTERFACES - A REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION DYNAMICS STUDY OF GAAS/ALXGA1-XAS(100) MULTIPLE QUANTUM-WELLS
YEN, MY
LEE, TC
CHEN, P
MADHUKAR, A
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (02): : 590 - 593
[73] CONDENSATION OF TUNGSTEN ON TUNGSTEN IN ATOMIC DETAIL - MONTE CARLO AND STATISTICAL CALCULATIONS VS EXPERIMENT
YOUNG, RD
SCHUBERT, DC
[J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 42 (11) : 3943 - &
[74] EFFECTS OF DIFFRACTION CONDITIONS AND PROCESSES ON RHEED INTENSITY OSCILLATIONS DURING THE MBE GROWTH OF GAAS
ZHANG, J
NEAVE, JH
DOBSON, PJ
JOYCE, BA
[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 42 (04): : 317 - 326

← 1 2 3 4 5 6 7 8 →