COMPARISON OF CARRIER LIFETIME MEASUREMENTS BY PHOTOCONDUCTIVE DECAY AND SURFACE PHOTO-VOLTAGE METHODS

被引：11

作者：

CHU, TL

STOKES, ED

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1978年 / 49卷 / 05期

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D O I：

10.1063/1.325149

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：2996 / 2997

页数：2

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