LOW-ENERGY ELECTRON-MICROSCOPY OF SURFACE PROCESSES

被引：7

作者：

BAUER, E

机构：

[1] Physikalisches Institut, Technische Universität Clausthal

来源：

APPLIED SURFACE SCIENCE | 1992年 / 60-1卷

关键词：

D O I：

10.1016/0169-4332(92)90443-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Low-energy electron microscopy (LEEM) is an ideal tool for the study of elementary processes on crystalline surfaces and -when combined with low-energy electron diffraction (LEED) for the atomic-scale characterization of thin films and surfaces. This is illustrated by the study of several processes on clean surfaces such as phase transitions, crystal growth and sublimation, by the study of thin film growth and desorption and by some results on oxidation and segregation.

引用

页码：350 / 358

页数：9

共 19 条

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