EXPERIMENTAL-DESIGN OF EXIT WAVE RECONSTRUCTION FROM A TRANSMISSION ELECTRON-MICROSCOPE DEFOCUS SERIES

被引：17

作者：

MIEDEMA, MAO

VANDENBOS, A

BUIST, AH

机构：

[1] Department of Applied Physics, Delft University of Technology

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1994年 / 43卷 / 02期

关键词：

D O I：

10.1109/19.293417

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Recently published methods reconstruct the complex exit wave of the specimen in a transmission electron microscope by combining a number of images recorded at different defocus values. An expression is derived for the variance of the reconstructed wave as a function of the experimental parameters that can be freely chosen. It is shown how these parameters can be used for experimental design, that is, for minimizing the variance of the reconstructed wave.

引用

页码：181 / 186

页数：6

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