DETECTION OF CURRENT FILAMENTS IN VO2 THIN-FILM SWITCHES USING SCANNING ELECTRON-MICROSCOPE

被引：12

作者：

BEAULIEU, RP ^{[1
]}

SULWAY, DV ^{[1
]}

COX, CD ^{[1
]}

机构：

[1] DEPT COMMUN, COMMUN RES CTR, OTTAWA, ONTARIO, CANADA

来源：

关键词：

D O I：

10.1016/0038-1101(73)90019-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：428 / +

页数：1

共 8 条

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DUCHENE, J ;

TERRAILL.M ;

PAILLY, P ;

ADAM, G .

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KAWAKUBO, T ;

NAKAGAWA, T .

[5] SEMICONDUCTING GLASSES .2. PROPERTIES AND INTERPRETATION [J].

OWEN, AE .

[6] DETECTION OF CURRENT FILAMENTS IN THIN AMORPHOUS FILMS [J].

SCHWARTZ, RJ ;

LUGINBUH.HW .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :65-&

[7]

THORNTON PR, 1968, SCANNING ELECTRON MI

[8]

VANSTEENSEL K, 1970, PHILIPS RES REP, V22, P170