EFFECT OF GAS EXPOSURE ON EPR SIGNAL FROM AMORPHOUS SILICON FILMS

被引：9

作者：

MILLER, DJ

HANEMAN, D

机构：

来源：

SOLID STATE COMMUNICATIONS | 1978年 / 27卷 / 02期

关键词：

D O I：

10.1016/0038-1098(78)90809-8

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：91 / 94

页数：4

共 16 条

[1] EFFECT OF OXYGEN ON THE ELECTRON SPIN RESONANCE SPECTRUM OF ALPHA,ALPHA'-DIPHENYL-BETA-PICRYLHYDRAZYL [J].

BENNETT, JE ;

MORGAN, EJH .

NATURE, 1958, 182 (4629) :199-200

[2] INFLUENCE OF EVAPORATION PARAMETERS ON ELECTRICAL PROPERTIES OF AMORPHOUS-GERMANIUM AND SILICON [J].

BEYER, W ;

STUKE, J .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 30 (02) :511-520

[3] EFFECT OF OXYGEN ON RESISTIVITY OF EVAPORATED AMORPHOUS-GERMANIUM THIN-FILMS [J].

CHEN, CC ;

CLARK, AH ;

KAZMERSKI, LL .

THIN SOLID FILMS, 1976, 32 (02) :L5-L8

[4]

DUSHMAN S, 1962, SCI F VACUUM TECHNIQ, P697

[5] OPTICAL EVIDENCE FOR A NETWORK OF CRACKLIKE VOIDS IN AMORPHOUS GERMANIUM [J].

GALEENER, FL .

PHYSICAL REVIEW LETTERS, 1971, 27 (25) :1716-&

[6] ELECTRICAL AND STRUCTURAL-PROPERTIES OF AMORPHOUS GERMANIUM [J].

HAUSER, JJ ;

STAUDINGER, A .

PHYSICAL REVIEW B, 1973, 8 (02) :607-615

[7] OBSERVATION OF STRONG BULK OXIDATION EFFECTS IN AMORPHOUS-GERMANIUM BY ULTRAVIOLET REFLECTANCE SPECTROSCOPY [J].

HELMS, CR ;

SPICER, WE ;

PERESKOKOV, V .

APPLIED PHYSICS LETTERS, 1974, 24 (07) :318-320

[8] AUGER-SPECTROSCOPY STUDIES OF OXIDATION OF AMORPHOUS AND CRYSTALLINE GERMANIUM [J].

HENRICH, VE ;

FAN, JCC .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) :1206-1213

[9]

LEMKE B, 1977, PHYS REV B

[10]

MILLER DJ, 1977, 7TH P INT VAC C 3RD

← 1 2 →