EFFECTS OF COVERAGE ON THE GEOMETRY AND ELECTRONIC-STRUCTURE OF AL OVERLAYERS ON SI(111)

被引:117
作者
HAMERS, RJ
机构
来源
PHYSICAL REVIEW B | 1989年 / 40卷 / 03期
关键词
D O I
10.1103/PhysRevB.40.1657
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1657 / 1671
页数:15
相关论文
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[1]   ANOMALOUS SURFACE RECONSTRUCTION - OBSERVATION OF SI(111) 2X1 ON SPUTTERED AND ANNEALED SI(111) SURFACES [J].
BECKER, RS ;
KLITSNER, T ;
VICKERS, JS .
PHYSICAL REVIEW B, 1988, 38 (05) :3537-3540
[2]  
BOLMONT D, 1984, J PHYS PARIS C, V45
[3]   ELECTRONIC-STRUCTURE OF AL CHEMISORBED ON SI(111) SURFACE [J].
CHELIKOWSKY, JR .
PHYSICAL REVIEW B, 1977, 16 (08) :3618-3627
[4]   PHASE-SEPARATION ON AN ATOMIC SCALE - THE FORMATION OF A NOVEL QUASIPERIODIC 2D-STRUCTURE [J].
DEMUTH, JE ;
KOEHLER, UK ;
HAMERS, RJ ;
KAPLAN, P .
PHYSICAL REVIEW LETTERS, 1989, 62 (06) :641-644
[5]   A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].
DEMUTH, JE ;
HAMERS, RJ ;
TROMP, RM ;
WELLAND, ME .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1320-1323
[6]   1ST-PRINCIPLES INVESTIGATION OF GEOMETRIC AND ELECTRONIC-STRUCTURES OF ALUMINUM ABSORBED ON SILICON SURFACES [J].
DEV, BN ;
MOHAPATRA, SM ;
MISHRA, KC ;
GIBSON, WM ;
DAS, TP .
PHYSICAL REVIEW B, 1987, 36 (05) :2666-2674
[7]   TUNNELING SPECTROSCOPY OF THE SI(111)2X1 SURFACE [J].
FEENSTRA, RM ;
STROSCIO, JA ;
FEIN, AP .
SURFACE SCIENCE, 1987, 181 (1-2) :295-306
[8]   ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL [J].
HAMERS, RJ ;
DEMUTH, JE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :512-516
[9]   ELECTRONIC-STRUCTURE OF LOCALIZED SI DANGLING-BOND DEFECTS BY TUNNELING SPECTROSCOPY [J].
HAMERS, RJ ;
DEMUTH, JE .
PHYSICAL REVIEW LETTERS, 1988, 60 (24) :2527-2530
[10]   IMAGING OF CHEMICAL-BOND FORMATION WITH THE SCANNING TUNNELING MICROSCOPE - NH3 DISSOCIATION ON SI(001) [J].
HAMERS, RJ ;
AVOURIS, P ;
BOZSO, F .
PHYSICAL REVIEW LETTERS, 1987, 59 (18) :2071-2074