COMPUTER-AIDED SPECKLE INTERFEROMETRY USING SPECTRAL AMPLITUDE FRINGES

被引:57
作者
CHEN, DJ
CHIANG, FP
机构
[1] Laboratory for Experimental Mechanics Research, State University of New York at Stony Brook, Stony Brook, NY
来源
APPLIED OPTICS | 1993年 / 32卷 / 02期
关键词
SPECKLE PHOTOGRAPHY AND INTERFEROMETRY; DEFORMATION; IMAGE PROCESSING; FAST-FOURIER TRANSFORM; DIFFRACTION; SPECTRAL ANALYSIS; SAMPLING; INTERPOLATION; STRAIN ANALYSIS;
D O I
10.1364/AO.32.000225
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A fully automatic speckle metrology technique is developed. Two speckle patterns of a specimen, one before and one after the specimen deformation, are captured by a video camera. An equivalent double-exposure speckle pattern is obtained by superimposing the two digital images. The superimposed speckle pattern is then segmented into a series of small subimages. For each subimage a fast-Fourier transform is applied and a computer-generated Young's fringe pattern is obtained. The fringe pattern, which characterizes the local displacement vector, is analyzed by a second fast-Fourier transform. The local displacement vector is determined by a cardinal interpolation and a crest searching around a signal peak in the second spectral domain. An artificial rigid shift between the two images is introduced in the cases of extremely large or small displacements. From analysis of all subimage pairs of the whole superimposed speckle pattern a complete two-dimensional displacement field is deduced. Experimental results using laser as well as white-light speckle patterns are demonstrated.
引用
收藏
页码:225 / 236
页数:12
相关论文
共 38 条
[21]   STRAIN ANALYSIS BY ONE BEAM LASER SPECKLE INTERFEROMETRY .1. SINGLE APERTURE METHOD [J].
KHETAN, RP ;
CHIANG, FP .
APPLIED OPTICS, 1976, 15 (09) :2205-2215
[22]   DETERMINATION OF PLASTIC STRAINS AT NOTCHES BY IMAGE-PROCESSING METHODS [J].
LEE, C ;
CHAO, YJ ;
SUTTON, MA ;
PETERS, WH ;
RANSON, WF .
EXPERIMENTAL MECHANICS, 1989, 29 (02) :214-220
[23]  
MADDUX GE, 1981, SPR P SEM C, P248
[24]   FIBER OPTIC PHASE STEPPING SYSTEM FOR INTERFEROMETRY [J].
MERCER, CR ;
BEHEIM, G .
APPLIED OPTICS, 1991, 30 (07) :729-734
[25]   AN ELECTRONIC SPECKLE PATTERN INTERFEROMETER FOR COMPLETE INPLANE DISPLACEMENT MEASUREMENT [J].
MOORE, AJ ;
TYRER, JR .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1990, 1 (10) :1024-1030
[26]   DIGITAL IMAGING TECHNIQUES IN EXPERIMENTAL STRESS-ANALYSIS [J].
PETERS, WH ;
RANSON, WF .
OPTICAL ENGINEERING, 1982, 21 (03) :427-431
[27]   AUTOMATIC FRINGE PATTERN-ANALYSIS - A REVIEW [J].
REID, GT .
OPTICS AND LASERS IN ENGINEERING, 1986, 7 (01) :37-68
[28]   DIGITAL PHASE STEPPING SPECKLE INTERFEROMETRY [J].
ROBINSON, DW ;
WILLIAMS, DC .
OPTICS COMMUNICATIONS, 1986, 57 (01) :26-30
[29]   AUTOMATIC FRINGE ANALYSIS WITH A COMPUTER IMAGE-PROCESSING SYSTEM [J].
ROBINSON, DW .
APPLIED OPTICS, 1983, 22 (14) :2169-2176
[30]   WHOLE FIELD INPLANE VIBRATION ANALYSIS USING PULSED PHASE-STEPPED ESPI [J].
SANTOYO, FM ;
SHELLABEAR, MC ;
TYRER, JR .
APPLIED OPTICS, 1991, 30 (07) :717-721