COIMPLANTATION AND ELECTRICAL-ACTIVITY OF C IN GAAS - STOICHIOMETRY AND DAMAGE EFFECTS

被引:29
作者
MOLL, AJ [1 ]
YU, KM [1 ]
WALUKIEWICZ, W [1 ]
HANSEN, WL [1 ]
HALLER, EE [1 ]
机构
[1] UNIV CALIF BERKELEY,DEPT MAT SCI & MINERAL ENGN,BERKELEY,CA 94720
关键词
D O I
10.1063/1.107004
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have coimplanted carbon and a series of elements (B, N, Al, P, Ar, Ga, As, and Kr) in GaAs to study the effect of both implant damage and stoichiometry on activation. Electrical activity of C was found to increase due to the additional damage caused by coimplantation of a heavy element regardless of the chemical nature of the coimplant. Maintaining stoichiometry by coimplanting a group III element further increased activation in substrates heavily damaged during implantation. Activation of 65 +/- 3%, corresponding to a sheet free-carrier concentration of 3.5 X 10(14) cm-2, was achieved by coimplanting Ga and annealing at 950-degrees-C for 10 s.
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页码:2383 / 2385
页数:3
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