DIRECTION OF ELECTROMIGRATION IN THIN SILVER, GOLD, AND COPPER FILMS

被引：44

作者：

HUMMEL, RE

BREITLING, RM

机构：

来源：

APPLIED PHYSICS LETTERS | 1971年 / 18卷 / 09期

关键词：

D O I：

10.1063/1.1653704

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：373 / +

页数：1

共 21 条

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[4]

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