OPEN-CIRCUIT TO SHORT-CIRCUIT SWITCHING - METHOD FOR LIFETIME MEASUREMENT IN SOLAR-CELLS

被引：8

作者：

DHARIWAL, SR

BASU, N

GADRE, R

机构：

[1] Department of Physics, Government College, Ajmer

来源：

ELECTRONICS LETTERS | 1979年 / 15卷 / 15期

关键词：

Minority carriers; Solar cells;

D O I：

10.1049/el:19790328

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new method is suggested for measurement of lifetime of photoinjected carriers in the base layer of a p-n junction solar cell. The cell is switched from the open-circuit to the short-circuit mode of operation by using a negative voltage pulse. C.R.O. trace of the output voltage pulse provides a direct means for lifetime measurement. © 1979, The Institution of Electrical Engineers. All rights reserved.

引用

页码：456 / 458

页数：3

共 5 条

[1] DESIGN CONSIDERATIONS FOR HIGH-INTENSITY SOLAR-CELLS [J].