SYNCHROTRON X-RAY MICROPROBE DETERMINATION OF CHROMATE CONTENT USING X-RAY-ABSORPTION NEAR-EDGE STRUCTURE

被引:136
作者
BAJT, S
CLARK, SB
SUTTON, SR
RIVERS, ML
SMITH, JV
机构
[1] UNIV CHICAGO,CTR ADV RADIAT SOURCES,CHICAGO,IL 60637
[2] BROOKHAVEN NATL LAB,DEPT APPL SCI,UPTON,NY 11973
[3] UNIV GEORGIA,SAVANNAH RIVER ECOL LAB,AIKEN,SC 29802
关键词
D O I
10.1021/ac00061a026
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
X-ray absorption near-edge structure (XANES) has been applied to the quantitative analysis of chromate (CrO42-) content in oxides, silicate glasses, and simulated cementitous waste forms. The method uses the normalized area of a pre-edge peak (bound-state transition) in XANES spectra acquired with the synchrotron X-ray microprobe on beam line X26A at the National Synchrotron Light Source. The estimated accuracy of the technique is +/- 5% in terms of Cr6+/total Cr. The minimum detection limit approaches 10 ppm Cr6+ using a 150-mum synchrotron X-ray beam. These results demonstrate the value of synchrotron-based microXANES for the nondestructive quantification of the first-row transition metal species present as tetrahedral oxyanions.
引用
收藏
页码:1800 / 1804
页数:5
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