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ADSORPTION OF OXYGEN ON A CLEAN SILICON SURFACE
被引:68
作者
:
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
MEYER, F
[
1
]
VRAKKING, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
VRAKKING, JJ
[
1
]
机构
:
[1]
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
来源
:
SURFACE SCIENCE
|
1973年
/ 38卷
/ 01期
关键词
:
D O I
:
10.1016/0039-6028(73)90296-3
中图分类号
:
O64 [物理化学(理论化学)、化学物理学];
学科分类号
:
070304 ;
081704 ;
摘要
:
引用
收藏
页码:275 / 281
页数:7
相关论文
共 22 条
[1]
MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
GOBELI, GW
论文数:
0
引用数:
0
h-index:
0
GOBELI, GW
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1965,
26
(02)
: 343
-
&
[2]
STUDY OF SILICON-OXYGEN INTERACTION WITH STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
BENNINGHOVEN, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
BENNINGHOVEN, A
STORP, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
STORP, S
[J].
APPLIED PHYSICS LETTERS,
1973,
22
(04)
: 170
-
171
[3]
BOONSTRA AH, 1968, PHILIPS RES REPT S3
[4]
CALORIMETRIC STUDY OF ADSORPTION OF OXYGEN AND GASES HXA ON GERMANIUM AND SILICON
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
BOOTSMA, GA
[J].
SURFACE SCIENCE,
1969,
15
(02)
: 340
-
&
[5]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[6]
ANALYSIS OF OUTERMOST ATOMIC LAYER OF A SURFACE BY LOW-ENERGY ION SCATTERING
BRONGERSMA, HH
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
BRONGERSMA, HH
MUL, PM
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
MUL, PM
[J].
SURFACE SCIENCE,
1973,
35
(01)
: 393
-
412
[7]
OXYGEN STICKING COEFFICIENTS ON CLEAN (111) SILICON SURFACES
CAROSELLA, CA
论文数:
0
引用数:
0
h-index:
0
机构:
Naval Research Laboratory, Washington
CAROSELLA, CA
COMAS, J
论文数:
0
引用数:
0
h-index:
0
机构:
Naval Research Laboratory, Washington
COMAS, J
[J].
SURFACE SCIENCE,
1969,
15
(02)
: 303
-
+
[8]
CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1970,
23
(02)
: 283
-
&
[9]
KINETICS AND MECHANISM OF OXYGEN ADSORPTION ON SINGLE CRYSTALS OF GERMANIUM
GREEN, M
论文数:
0
引用数:
0
h-index:
0
GREEN, M
LIBERMAN, A
论文数:
0
引用数:
0
h-index:
0
LIBERMAN, A
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1962,
23
(OCT)
: 1407
-
+
[10]
THE ADSORPTION OF OXYGEN ON CLEAN SILICON SURFACES
GREEN, M
论文数:
0
引用数:
0
h-index:
0
GREEN, M
MAXWELL, KH
论文数:
0
引用数:
0
h-index:
0
MAXWELL, KH
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1960,
13
(1-2)
: 145
-
150
←
1
2
3
→
共 22 条
[1]
MEASUREMENT OF OXYGEN ADSORPTION ON SILICON BYELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
GOBELI, GW
论文数:
0
引用数:
0
h-index:
0
GOBELI, GW
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1965,
26
(02)
: 343
-
&
[2]
STUDY OF SILICON-OXYGEN INTERACTION WITH STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
BENNINGHOVEN, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
BENNINGHOVEN, A
STORP, S
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
UNIV COLOGNE, PHYS INST 1, COLOGNE 5000, WEST GERMANY
STORP, S
[J].
APPLIED PHYSICS LETTERS,
1973,
22
(04)
: 170
-
171
[3]
BOONSTRA AH, 1968, PHILIPS RES REPT S3
[4]
CALORIMETRIC STUDY OF ADSORPTION OF OXYGEN AND GASES HXA ON GERMANIUM AND SILICON
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
BOOTSMA, GA
[J].
SURFACE SCIENCE,
1969,
15
(02)
: 340
-
&
[5]
ELLIPSOMETRY IN SUB-MONOLAYER REGION
BOOTSMA, GA
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
BOOTSMA, GA
MEYER, F
论文数:
0
引用数:
0
h-index:
0
机构:
Philips Research Laboratories, N.V. Philips' Gloeilampenfabrieken, Eindhoven
MEYER, F
[J].
SURFACE SCIENCE,
1969,
14
(01)
: 52
-
&
[6]
ANALYSIS OF OUTERMOST ATOMIC LAYER OF A SURFACE BY LOW-ENERGY ION SCATTERING
BRONGERSMA, HH
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
BRONGERSMA, HH
MUL, PM
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
PHILIPS RES LABS, EINDHOVEN, NETHERLANDS
MUL, PM
[J].
SURFACE SCIENCE,
1973,
35
(01)
: 393
-
412
[7]
OXYGEN STICKING COEFFICIENTS ON CLEAN (111) SILICON SURFACES
CAROSELLA, CA
论文数:
0
引用数:
0
h-index:
0
机构:
Naval Research Laboratory, Washington
CAROSELLA, CA
COMAS, J
论文数:
0
引用数:
0
h-index:
0
机构:
Naval Research Laboratory, Washington
COMAS, J
[J].
SURFACE SCIENCE,
1969,
15
(02)
: 303
-
+
[8]
CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1970,
23
(02)
: 283
-
&
[9]
KINETICS AND MECHANISM OF OXYGEN ADSORPTION ON SINGLE CRYSTALS OF GERMANIUM
GREEN, M
论文数:
0
引用数:
0
h-index:
0
GREEN, M
LIBERMAN, A
论文数:
0
引用数:
0
h-index:
0
LIBERMAN, A
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1962,
23
(OCT)
: 1407
-
+
[10]
THE ADSORPTION OF OXYGEN ON CLEAN SILICON SURFACES
GREEN, M
论文数:
0
引用数:
0
h-index:
0
GREEN, M
MAXWELL, KH
论文数:
0
引用数:
0
h-index:
0
MAXWELL, KH
[J].
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS,
1960,
13
(1-2)
: 145
-
150
←
1
2
3
→