SIMULTANEOUS OBSERVATION OF ATOMICALLY RESOLVED AFM STM IMAGES OF A GRAPHITE SURFACE

被引：21

作者：

SUGAWARA, Y ^{[1
]}

ISHIZAKA, T ^{[1
]}

MORITA, S ^{[1
]}

IMAI, S ^{[1
]}

MIKOSHIBA, N ^{[1
]}

机构：

[1] TOHOKU UNIV,ELECT COMMUN RES INST,SENDAI,MIYAGI 980,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1990年 / 29卷 / 01期

关键词：

AFM; AFM/STM; Atomic force microscope; Atomic force microscope/scanning tunneling microscope; Atomically resolved image; Contact force; Graphite surface; Scanning tunneling microscope; STM; Surface conductance;

D O I：

10.1143/JJAP.29.L157

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We constructed an AFM/STM system with a conductive lever. We applied this system to the observation of a graphite surface in air. As a result, for the first time, atomically resolved AFM and STM images were obtained simultaneously, and it was found that the lattice pattern appearing in the AFM image was different from that in the STM image. In both AFM and STM images, distortion of lattice periodicity due to frictional effect was observed. © 1990 IOP Publishing Ltd.

引用

页码：L157 / L159

页数：3

共 10 条

[1] ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS [J].

ALBRECHT, TR ;

QUATE, CF .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :271-274

[2] THEORETICAL SCANNING TUNNELING MICROSCOPY AND ATOMIC FORCE MICROSCOPY STUDY OF GRAPHITE INCLUDING TIP SURFACE INTERACTION [J].

BATRA, IP ;

CIRACI, S .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (02) :313-318

[3] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[4]

BINNIG G, 1985, PHYS REV B, V31, P2602

[5]

ISHIZAKA T, 1990, J VAC SCI TECHNOL A, V8

[6] ATOMIC FORCE MICROSCOPY OF LIQUID-COVERED SURFACES - ATOMIC RESOLUTION IMAGES [J].

MARTI, O ;

DRAKE, B ;

HANSMA, PK .

APPLIED PHYSICS LETTERS, 1987, 51 (07) :484-486

[7] DIRECT MEASUREMENT OF FORCES DURING SCANNING TUNNELING MICROSCOPE IMAGING OF GRAPHITE [J].

MATE, CM ;

ERLANDSSON, R ;

MCCLELLAND, GM ;

CHIANG, S .

SURFACE SCIENCE, 1989, 208 (03) :473-486

[8] COMPARATIVE-STUDY OF LITHIUM-FLUORIDE AND GRAPHITE BY ATOMIC FORCE MICROSCOPY (AFM) [J].

MEYER, E ;

HEINZELMANN, H ;

GRUTTER, P ;

JUNG, T ;

WEISSKOPF, T ;

HIDBER, HR ;

LAPKA, R ;

RUDIN, H ;

GUNTHERODT, HJ .

JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :269-280

[9] SURFACE CONDUCTANCE OF METAL-SURFACES IN AIR STUDIED WITH A FORCE MICROSCOPE [J].

MORITA, S ;

ISHIZAKA, T ;

SUGAWARA, Y ;

OKADA, T ;

MISHIMA, S ;

IMAI, S ;

MIKOSHIBA, N .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (09) :L1634-L1636

[10] THEORY AND OBSERVATION OF HIGHLY ASYMMETRIC ATOMIC-STRUCTURE IN SCANNING-TUNNELING-MICROSCOPY IMAGES OF GRAPHITE [J].

TOMANEK, D ;

LOUIE, SG ;

MAMIN, HJ ;

ABRAHAM, DW ;

THOMSON, RE ;

GANZ, E ;

CLARKE, J .

PHYSICAL REVIEW B, 1987, 35 (14) :7790-7793

← 1 →