CHARACTERIZATION OF CDTE POLYCRYSTALLINE FILMS BY X-RAY PHOTOELECTRON AND AUGER SPECTROSCOPIES

被引：10

作者：

ZELAYA, O

SANCHEZSINENCIO, F

GONZALEZHERNANDEZ, J

PENA, JL

FARIAS, MH

COTAARAIZA, L

HIRATA, GA

RABAGO, F

机构：

[1] INST POLITECN NACL,CTR INVEST & ESTUDIOS AVANZADOS,UNIDAD MERIDA,MERIDA 97310,YUCATAN,MEXICO

[2] UNIV NACL AUTONOMA MEXICO,INST FIS,ENSENADA LAB,ENSENADA 22800,MEXICO

[3] UNIV AUTONOM SAN LUIS POTOSI,INST FIS,SAN LUIS POTOSI,SAN LUIS POTOSI,MEXICO

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 02期

关键词：

D O I：

10.1116/1.576126

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：245 / 248

页数：4

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