RAMAN-SPECTRA OF SIZE-SELECTED SILICON CLUSTERS AND COMPARISON WITH CALCULATED STRUCTURES

被引:370
作者
HONEA, EC
OGURA, A
MURRAY, CA
RAGHAVACHARI, K
SPRENGER, WO
JARROLD, MF
BROWN, WL
机构
[1] NORTHWESTERN UNIV, DEPT CHEM, EVANSTON, IL 60208 USA
[2] NEC CORP LTD, MICROELECTR RES LABS, TSUKUBA, JAPAN
关键词
D O I
10.1038/366042a0
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
SMALL clusters of silicon, containing between 2 and 100 atoms, have been studied extensively both because of their intrinsic interest from the point of view of chemical structure and bonding and because of the potential technological applications of cluster-assembled materials1-3. Ab initio quantum-chemical calculations predict that very small clusters should have structures markedly different from that of the crystalline phase4-12. Experiments on two- (ref. 13), three- (ref. 14) and four-atom15 clusters have allowed some comparison with theoretical predictions, but structural information on larger clusters has been only indirect16. Here we report on structural studies of size-selected Si4, Si6 and Si7 clusters prepared and isolated by low-energy deposition into a solid nitrogen matrix. Surface plasmon-polariton enhanced Raman spectroscopy17-20 yields well resolved vibrational spectra for each of these clusters in which the vibrational frequencies agree well with those predicted for optimized structures calculated by ab initio methods. We confirm that Si4 is a planar rhombus, and find that Si6 is a distorted octahedron and Si7 a pentagonal bipyramid.
引用
收藏
页码:42 / 44
页数:3
相关论文
共 30 条
  • [1] RESEARCH OPPORTUNITIES ON CLUSTERS AND CLUSTER-ASSEMBLED MATERIALS - A DEPARTMENT OF ENERGY, COUNCIL ON MATERIALS SCIENCE PANEL REPORT
    ANDRES, RP
    AVERBACK, RS
    BROWN, WL
    BRUS, LE
    GODDARD, WA
    KALDOR, A
    LOUIE, SG
    MOSCOVITS, M
    PEERCY, PS
    RILEY, SJ
    SIEGEL, RW
    SPAEPEN, F
    WANG, Y
    [J]. JOURNAL OF MATERIALS RESEARCH, 1989, 4 (03) : 704 - 736
  • [2] [Anonymous], 1986, AB INITIO MOL ORBITA
  • [3] REASSIGNMENT OF THE SI2- PHOTODETACHMENT SPECTRA
    ARNOLD, CC
    KITSOPOULOS, TN
    NEUMARK, DM
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1993, 99 (01) : 766 - 768
  • [4] STUDY OF SI4 AND SI4- USING THRESHOLD PHOTODETACHMENT (ZEKE) SPECTROSCOPY
    ARNOLD, CC
    NEUMARK, DM
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1993, 99 (05) : 3353 - 3362
  • [5] EQUILIBRIUM STRUCTURES AND FINITE TEMPERATURE PROPERTIES OF SILICON MICROCLUSTERS FROM ABINITIO MOLECULAR-DYNAMICS CALCULATIONS
    BALLONE, P
    ANDREONI, W
    CAR, R
    PARRINELLO, M
    [J]. PHYSICAL REVIEW LETTERS, 1988, 60 (04) : 271 - 274
  • [6] PROPERTIES OF DEPOSITED SIZE-SELECTED CLUSTERS - REACTIVITY OF DEPOSITED SILICON CLUSTERS
    BOWER, JE
    JARROLD, MF
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1992, 97 (11) : 8312 - 8321
  • [7] COVALENT GROUP-IV ATOMIC CLUSTERS
    BROWN, WL
    FREEMAN, RR
    RAGHAVACHARI, K
    SCHLUTER, M
    [J]. SCIENCE, 1987, 235 (4791) : 860 - 865
  • [8] SURFACE-ELECTROMAGNETIC-WAVE-ENHANCED RAMAN-SCATTERING BY OVERLAYERS ON METALS
    CHEN, YJ
    CHEN, WP
    BURSTEIN, E
    [J]. PHYSICAL REVIEW LETTERS, 1976, 36 (20) : 1207 - 1210
  • [9] Driscoll W.G., 1978, HDB OPTICS
  • [10] DENSITY FUNCTIONAL-STUDY OF THE BONDING IN SMALL SILICON CLUSTERS
    FOURNIER, R
    SINNOTT, SB
    DEPRISTO, AE
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1992, 97 (06) : 4149 - 4161