ROLE OF A POLYSILICON LAYER IN THE REDUCTION OF LATTICE-DEFECTS ASSOCIATED WITH PHOSPHORUS PREDEPOSITION IN SILICON

被引:5
作者
ARMIGLIATO, A
SERVIDORI, M
SOLMI, S
ZANI, A
机构
关键词
D O I
10.1007/BF00551800
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:1124 / 1130
页数:7
相关论文
共 17 条
[1]   SIP PRECIPITATION WITHIN DOPED SILICON LATTICE, CONCOMITANT WITH PHOSPHORUS PREDEPOSITION [J].
ARMIGLIATO, A ;
NOBILI, D ;
SERVIDORI, M ;
SOLMI, S .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (12) :5489-5491
[2]   GROWTH OF STACKING-FAULTS AND DISLOCATIONS INDUCED IN SILICON BY PHOSPHORUS PREDEPOSITION [J].
ARMIGLIATO, A ;
SERVIDORI, M ;
SOLMI, S ;
VECCHI, I .
JOURNAL OF APPLIED PHYSICS, 1977, 48 (05) :1806-1812
[3]  
CLALYS CL, 1977, SEMICONDUCTOR CHARAC, P366
[4]   CHARACTERIZATION OF MICROPLASMA SITES IN SILICON N+-P JUNCTIONS [J].
DONOLATO, C ;
MERLI, PG ;
VECCHI, I .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (03) :473-474
[5]  
FINETTI M, SOLID STATE ELECTRON
[6]  
FINETTI M, UNPUBLISHED
[7]  
FINETTI M, 1978, P IEEE PHOTOVOLTAIC
[8]  
GHEZZI C, 1974, J MATER SCI, V9, P1797, DOI 10.1007/BF00541748
[9]   STUDIES OF PUSH-OUT EFFECT IN SILICON .1. COMPARISON OF SEQUENTIAL BORON-PHOSPHORUS AND GALLIUM-PHOSPHORUS DIFFUSIONS [J].
JONES, CL ;
WILLOUGHBY, AFW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (11) :1531-1538
[10]  
Lindmayer J., 1972, 9TH IEEE PHOT SPEC C, P83