LOW-ENERGY ION REFLECTION FROM METAL-SURFACES

被引：42

作者：

SUURMEIJER, EP ^{[1
]}

BOERS, AL ^{[1
]}

机构：

[1] STATE UNIV GRONINGEN, TECH PHYS LABS, GRONINGEN, NETHERLANDS

来源：

关键词：

D O I：

10.1016/0039-6028(74)90236-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：309 / 352

页数：44

共 169 条

[71] Firsov O. B., 1967, SOV PHYS DOKL, V11, P732
[72] FIRSOV OB, 1959, SOV PHYS JETP-USSR, V9, P1076
[73] FIRSOV OB, 1958, SOV PHYS JETP-USSR, V6, P534
[74] FIRSOV OB, 1957, SOV PHYS JETP-USSR, V5, P1192
[75] EMISSION OF FAST SECONDARY ATOMS FROM IONICALLY BOMBARDED COPPER ( REFLECTIONS )
FLUIT, JM
SNOEK, C
KISTEMAKER, J
[J]. PHYSICA, 1964, 30 (04): : 870 - &
[76] MEASUREMENTS OF LARGE-ANGLE SINGLE COLLISIONS BETWEEN HELIUM, NEON, AND ARGON ATOMS AT ENERGIES TO 100 KEV
FULS, EN
JONES, PR
ZIEMBA, FP
EVERHART, E
[J]. PHYSICAL REVIEW, 1957, 107 (03): : 704 - 710
[77] GAY WL, 1964, PHYS REV, V135, P1780
[78] SURFACE COMPOSITION ANALYSIS BY BINARY SCATTERING OF NOBLE GAS IONS
GOFF, RF
SMITH, DP
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (01): : 72 - +
[79] GOMBAS P, 1956, HDB PHYSIK, V36
[80] ANALYSIS OF SILICON NITRIDE LAYERS ON SILICON BY BACKSCATTERING AND CHANNELING EFFECT MEASUREMENTS
GYULAI, J
MEYER, O
MAYER, JW
RODRIGUE.V
[J]. APPLIED PHYSICS LETTERS, 1970, 16 (06) : 232 - &