METHODS FOR ACCURATE DETERMINATION OF EMISSION RATE AND TRAP CONCENTRATION WITH APPLICATION TO PLATINUM-DOPED SILICON

被引：9

作者：

THURBER, WR

LOWNEY, JR

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 02期

关键词：

D O I：

10.1063/1.339779

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：534 / 540

页数：7

共 16 条

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