CHARACTERIZATION OF TIO2-BASED SENSOR MATERIALS USING IMMITTANCE SPECTROSCOPY

被引：40

作者：

AZAD, AM ^{[1
]}

YOUNKMAN, LB ^{[1
]}

AKBAR, SA ^{[1
]}

ALIM, MA ^{[1
]}

机构：

[1] HUBBELL INC,OHIO BRASS CO,WADSWORTH,OH 44281

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1994年 / 77卷 / 02期

关键词：

D O I：

10.1111/j.1151-2916.1994.tb07017.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The ac electrical data, monitored in the frequency range 5 Hz equal to or less than f equal to or less than 13 MHz, are used to establish the microstructure-property response of titania-based composite polycrystalline sensor materials. These electrical data, when analyzed utilizing the lumped parameter/complex plane analysis, reveal several contributions from simultaneously operating mechanisms to the terminal admittance of the grain boundary. The nature of the electrically conducting paths, consisting of the lumped series-parallel network in the microstructure, is suggested via an equivalent circuit representation incorporating the underlying mechanisms in a systematic manner.

引用

页码：481 / 486

页数：6

共 15 条

[1] COMPLEX-PLANE ANALYSIS OF TRAPPING PHENOMENA IN ZINC-OXIDE BASED VARISTOR GRAIN-BOUNDARIES [J].