ELLIPSOMETRY IN STUDY OF SELECTIVE RADIATION - ABSORBING SURFACES

被引：11

作者：

LUSHIKU, EM ^{[1
]}

OSHEA, KR ^{[1
]}

机构：

[1] UNIV DAR ES SALAAM,DEPT PHYS,DAR ES SALAAM,TANZANIA

来源：

SOLAR ENERGY | 1977年 / 19卷 / 03期

关键词：

D O I：

10.1016/0038-092X(77)90070-6

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

引用

页码：271 / 276

页数：6

共 14 条

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[3]

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[7] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY [J].

MCCRACKIN, FL ;

PASSAGLIA, E ;

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STEINBERG, HL .

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NAG H, 1971, J PHYS, V4, P829

[9] ELLIPSOMETRY AND ITS APPLICATIONS TO SURFACE EXAMINATION [J].

NEAL, WEJ ;

FANE, RW .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1973, 6 (05) :409-416

[10]

OLLARD EA, 1964, HDB ELECTROPLATING

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