3D characterization of crystallographic orientation in polycrystals via EBSD

被引：2

作者：

Stefan ZAEFFERER ^{[1
]}

Stuart IWRIGHT ^{[2
]}

机构：

[1] Max-Planck-Institute for Iron Research,Max-Planck Straβe , Düsseldorf,Germany

[2] EDAX-TSL, East South,Suite H,Draper,UT

来源：

中国体视学与图像分析 | 2007年 / 04期

关键词：

EBSD; SEM; FIB; OIM;

D O I：

10.13505/j.1007-1482.2007.04.001

中图分类号：

TG115.23 [射线衍射分析];

学科分类号：

摘要：

Electron Backscatter Diffraction(EBSD) has been used in conjunction with a Scanning Electron Microscope(SEM) combined with a focused ion beam(FIB) instrument to obtain three dimensional(3D) high resolution characterizations of crystalline microstructures.This work reports on continued development that has proceeded on this technique.The technique is based on automated in-situ serial sectioning using the FIB and characterization of the sections using automated EBSD or orientation imaging microscopy(OIM).The technique extends the powerful features of two dimensional OIM into the third spatial dimension.This allows additional descriptive microstructural parameters to be obtained,for example the morphology and the crystallographic indices of interface planes.This paper provides an overview of the technique and shows results from two different samples: pearlite colonies in a high carbon steel and twin related grain triplets in a NiCo thin film.

引用

页码：233 / 238

页数：6

共 11 条

[1] Three Dimensional Microstructure–Microtexture Characterization of Pipeline Steel[J] . Petrov Roumen H.,García Orlando León,Mulders J.J.L.,Reis Ana Carmen C.,Bae Jin Ho,Kestens Leo A.I.,Houbaert Yvan.Materials Science Forum . 2007 (550)
[2] Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy
Lauridsen, E. M.
Schmidt, S.
Nielsen, S. F.
Margulies, L.
Poulsen, H. F.
Jensen, D. Juul
[J]. SCRIPTA MATERIALIA, 2006, 55 (01) : 51 - 56
[3] Characterization of the microstructure and texture of nanostructured electrodeposited NiCo using electron backscatter diffraction (EBSD)
Bastos, A.
Zaefferer, S.
Raabe, D.
Schuh, C.
[J]. ACTA MATERIALIA, 2006, 54 (09) : 2451 - 2462
[4] 3D reconstruction and characterization of polycrystalline microstructures using a FIB–SEM system[J] . M.A. Groeber,B.K. Haley,M.D. Uchic,D.M. Dimiduk,S. Ghosh.Materials Characterization . 2006 (4)
[5] Three-Dimensional Texture Analysis[J] . Mulders J.J.L.,Day A.P..Materials Science Forum . 2005 (495)
[6] Texture and Microstructure Imaging by the Moving Area Detector Method[J] . Preusser Andrea,Klein Helmut,Bunge Hans Joachim.Solid State Phenomena . 2005 (105)
[7] Electron backscattering diffraction investigation of focused ion beam surfaces
Matteson, TL
Schwarz, SW
Houge, EC
Kempshall, BW
Giannuzzi, LA
[J]. JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (01) : 33 - 39
[8] Orientation imaging: The emergence of a new microscopy[J] . Brent L. Adams,Stuart I. Wright,Karsten Kunze.Metallurgical Transactions A . 1993 (4)
[9] Description of the intercrystalline structure distribution in polycrystalline materials[J] . Brent L. Adams.Metallurgical Transactions A . 1986 (12)
[10] EBSD studies on wear-induced subsurface regions in LIGA nickel. S. V. Prasad J. R. Michael and T. R. Christenson. Scripta Materialia . 2003

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