c-axis oriented ferroelectric thin films of PbTiO3 on Si by pulsed laser ablation

被引:26
作者
Palkar, VR
Purandare, SC
Pai, SP
Chattopadhyay, S
Apte, PR
Pinto, R
Multani, MS
机构
[1] Tata Institute of Fundamental Research, Bombay 400-005, Homi Bhabha Road
关键词
D O I
10.1063/1.116687
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have deposited single phase c-axis oriented ferroelectric thin films of PbTiO3 on Si(100) by pulsed laser ablation technique in situ. It has been shown that the formation of a nonferroelectric, Pb2Ti2O6 pyrochlore phase at the interface could be avoided by raising the substrate temperature. (C) 1996 American Institute of Physics.
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页码:1582 / 1584
页数:3
相关论文
共 15 条
[1]   SIZE-INDUCED DIFFUSE PHASE-TRANSITION IN THE NANOCRYSTALLINE FERROELECTRIC PBTIO3 [J].
CHATTOPADHYAY, S ;
AYYUB, P ;
PALKAR, VR ;
MULTANI, M .
PHYSICAL REVIEW B, 1995, 52 (18) :13177-13183
[2]   EPITAXIAL PBTIO3 THIN-FILMS GROWN BY ORGANOMETALLIC CHEMICAL VAPOR-DEPOSITION [J].
DEKEIJSER, M ;
DORMANS, GJM ;
CILLESSEN, JFM ;
DELEEUW, DM ;
ZANDBERGEN, HW .
APPLIED PHYSICS LETTERS, 1991, 58 (23) :2636-2638
[3]   EFFECTS OF HOMOEPITAXIAL SURFACES AND INTERFACE COMPOUNDS ON THE INPLANE EPITAXY OF YBCO FILMS ON YTTRIA-STABILIZED ZIRCONIA [J].
FORK, DK ;
GARRISON, SM ;
HAWLEY, M ;
GEBALLE, TH .
JOURNAL OF MATERIALS RESEARCH, 1992, 7 (07) :1641-1651
[4]   STRUCTURAL-PROPERTIES AND INTERFACIAL LAYER FORMATION MECHANISMS OF PBTIO3 THIN-FILMS GROWN ON P-SI SUBSTRATES [J].
KIM, TW ;
YOON, YS ;
YOM, SS ;
LEE, JY .
APPLIED PHYSICS LETTERS, 1994, 64 (20) :2676-2678
[5]  
Kushida K., 1985, Japanese Journal of Applied Physics, Supplement, V24, P407
[6]   METALORGANIC CHEMICAL VAPOR-DEPOSITION OF PBTIO3 THIN-FILMS [J].
KWAK, BS ;
BOYD, EP ;
ERBIL, A .
APPLIED PHYSICS LETTERS, 1988, 53 (18) :1702-1704
[7]  
LIJMA K, 1986, J APPL PHYS, V60, P361
[8]  
MARTIN FW, 1965, PHYS CHEM GLASSES, V6, P143
[9]  
PALKAR VR, UNPUB
[10]   ORIENTED FERROELECTRIC THIN-FILMS OF PBTIO3,(PB,LA)TIO3, AND PB(ZR,TI)O-3 BY NEBULIZED SPRAY-PYROLYSIS [J].
RAJU, AR ;
RAO, CNR .
APPLIED PHYSICS LETTERS, 1995, 66 (07) :896-898