Preparation of SrTiO3 films on 8-inch wafers by chemical vapor deposition

被引:7
作者
Arai, TT
Inaishi, Y
Sawado, Y
Kobayashi, I
Hidaka, J
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 9B期
关键词
CVD; SrTiO3; Sr(DPM)(2); ferroelectric thin film; uniformity; deposition rate; transport efficiency; step coverage;
D O I
10.1143/JJAP.35.4875
中图分类号
O59 [应用物理学];
学科分类号
摘要
SrTiO3 films were grown on 8-inch-diameter Si substrates by chemical vapor deposition [CVD] using bis(dipivaloymethanato) strontium [Sr(DPM)(2)], titanium tetraisopropoxide [Ti(OiPr)(4)] and O-2. We have developed an oil-circulating showerhead-type nozzle to prevent condensation and decomposition of source materials. Conditions of supplying Sr(DPM)(2) were investigated with respect to cylinder pressure and the charge in the cylinder, using a simple vapor transport system. The deposition rate of SrTiO3 films on 8-inch wafers was improved to 2nm/min by increasing the charge in the source cylinder and decreasing the cylinder pressure. A thickness uniformity of 3.4% and a composition uniformity of 4.6% were obtained by complete mixing of gases. A step coverage of 85% was obtained using Sr(DPM)(2), titanyl bis(dipivaloylmethanato) [TiO(DPM)(2)] and N2O.
引用
收藏
页码:4875 / 4879
页数:5
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