Quantum chemical study of the mechanism of aluminum oxide atomic layer deposition

被引:166
作者
Widjaja, Y
Musgrave, CB [1 ]
机构
[1] Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
关键词
D O I
10.1063/1.1473237
中图分类号
O59 [应用物理学];
学科分类号
摘要
The atomic layer deposition of alumina using water and trimethylaluminum is investigated using the density functional theory. The atomistic mechanisms of the two deposition half-cycles on Al-CH3* and Al-OH* surface sites are investigated. Both half-cycle reactions proceed through the formation of an Al-O Lewis acid-base complex followed by CH4 formation. The Al-O complexes are relatively stable, with formation energies between 0.57 and 0.74 eV. The CH4 formation activation energies range from 0.52 to 0.91 eV and both half-cycle reactions are exothermic with overall enthalpies of reaction between 1.30 and 1.70 eV. (C) 2002 American Institute of Physics.
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收藏
页码:3304 / 3306
页数:3
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