Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy

被引：39

作者：

Marcus, MS

Carpick, RW

Sasaki, DY

Eriksson, MA

机构：

[1] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA

[2] Univ Wisconsin, Dept Engn Phys, Mat Sci Program, Madison, WI 53706 USA

[3] Univ Wisconsin, Rheol Res Ctr, Madison, WI 53706 USA

[4] Sandia Natl Labs, Biomol Mat & Interface Sci Dept, Albuquerque, NM 87185 USA

来源：

PHYSICAL REVIEW LETTERS | 2002年 / 88卷 / 22期

关键词：

D O I：

10.1103/PhysRevLett.88.226103

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Phase contrast in intermittent-contact atomic force microscopy (AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This is surprising, because measurements of nanoscale in-plane properties typically require contact mode microscopies. Our measurements are possible because the tip oscillates not just perpendicular but also parallel to the sample surface along the long axis of the cantilever. This lateral tip displacement is virtually universal in AFM, implying that any oscillating-tip AFM technique is sensitive to in-plane material properties.

引用

页码：4 / 226103

页数：4

共 32 条

[1] Influence of noncontact dissipation in the tapping mode:: Attempt to extract quantitative information on the surface properties with the local force probe method [J].