The selective etching with H+ ions and its effect on the oriented growth of diamond films

被引:38
作者
Zhang, WJ
Jiang, X
Xia, YB
机构
[1] Fraunhofer-Inst. F. Schicht- O., Bienroder Weg 54E
[2] Department of Chemistry, Lanzhou University
[3] Inorganic Materials Department, Shanghai University
关键词
D O I
10.1063/1.365995
中图分类号
O59 [应用物理学];
学科分类号
摘要
A novel etching effect of hydrogen ions on the growth of diamond films was observed. The Ht ion bombardment was performed by applying a negative substrate bias during a microwave plasma chemical vapor deposition process, using only hydrogen as a reactant gas. The effect of this bombardment was investigated by means of scanning electron microscopy. It was found that the etching efficiency of H+ ions on non-[001]-oriented grains is more significant than that on grains with their (001) faces parallel to the substrate, A lateral growth of the (001) faces can occur during the bombardment process. As a result, the size of (001) faces increases after Hi etching while grains with other directions are etched off. This effect provides a way to improve the orientation degree of [001] oriented diamond films and might be helpful for obtaining [001] oriented diamond films with small thickness. (C) 1997 American Institute of Physics.
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页码:1896 / 1899
页数:4
相关论文
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APPLIED PHYSICS LETTERS, 1996, 68 (16) :2195-2197
[12]  
ZHANG WJ, 1996, J CRYST GROWTH, V171, P485