Conduction channel transmissions of atomic-size aluminum contacts

被引:368
作者
Scheer, E
Joyez, P
Esteve, D
Urbina, C
Devoret, MH
机构
[1] Service de Physique de l’Etat Condensé, Commissariat à l’Energie Atomique, Gif-sur-Yvette Cedex
关键词
D O I
10.1103/PhysRevLett.78.3535
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have determined the individual transmission coefficients of Al quantum point contacts containing up to six conduction channels. The determination is based on a comparison of the highly nonlinear current-voltage characteristics in the superconducting state with the predictions of the theory for a single channel superconducting contact. We find that at least two channels contribute to the transport even for contacts with conductance lower than the conductance quantum.
引用
收藏
页码:3535 / 3538
页数:4
相关论文
共 26 条
  • [21] Conductance step for a single-atom contact in the scanning tunneling microscope: Noble and transition metals
    Sirvent, C
    Rodrigo, JG
    Vieira, S
    Jurczyszyn, L
    Mingo, N
    Flores, F
    [J]. PHYSICAL REVIEW B, 1996, 53 (23): : 16086 - 16090
  • [22] JUMPS IN ELECTRONIC CONDUCTANCE DUE TO MECHANICAL INSTABILITIES
    TODOROV, TN
    SUTTON, AP
    [J]. PHYSICAL REVIEW LETTERS, 1993, 70 (14) : 2138 - 2141
  • [23] Conductance and mechanical properties of atomic-size metallic contacts: A simple model
    Torres, JA
    Saenz, JJ
    [J]. PHYSICAL REVIEW LETTERS, 1996, 77 (11) : 2245 - 2248
  • [24] SUBGAP STRUCTURE AS FUNCTION OF THE BARRIER IN ATOM-SIZE SUPERCONDUCTING TUNNEL-JUNCTIONS
    VANDERPOST, N
    PETERS, ET
    YANSON, IK
    VANRUITENBEEK, JM
    [J]. PHYSICAL REVIEW LETTERS, 1994, 73 (19) : 2611 - 2613
  • [25] Adjustable nanofabricated atomic size contacts
    vanRuitenbeek, JM
    Alvarez, A
    Pineyro, I
    Grahmann, C
    Joyez, P
    Devoret, MH
    Esteve, D
    Urbina, C
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (01) : 108 - 111
  • [26] MINIATURE ELECTRICAL FILTERS FOR SINGLE-ELECTRON DEVICES
    VION, D
    ORFILA, PF
    JOYEZ, P
    ESTEVE, D
    DEVORET, MH
    [J]. JOURNAL OF APPLIED PHYSICS, 1995, 77 (06) : 2519 - 2524