Conductance step for a single-atom contact in the scanning tunneling microscope: Noble and transition metals

被引：95

作者：

Sirvent, C

Rodrigo, JG

Vieira, S

Jurczyszyn, L

Mingo, N

Flores, F

机构：

[1] Instituto de Ciencia de Materiales "Nicolás Cabrera,", Universidad Autónoma de Madrid

来源：

PHYSICAL REVIEW B | 1996年 / 53卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.53.16086

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Conductance steps for atomic point contacts of An, Ni, and Pt have been measured. Jump-to-contact and jump-to-tunnel processes have been identified and their conductances measured. Differences between conductance steps for noble and transition metals are interpreted as being due to the d orbitals that, in transition metals, provide new channels to the electron conductance. This interpretation is supported by a theoretical analysis, which shows good agreement with the experimental data.

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页码：16086 / 16090

页数：5

相关论文

共 25 条

[1] ATOMIC-SCALE CONNECTIVE NECK FORMATION AND CHARACTERIZATION [J].

AGRAIT, N ;

RODRIGO, JG ;

SIRVENT, C ;

VIEIRA, S .

PHYSICAL REVIEW B, 1993, 48 (11) :8499-8501

[2] PLASTIC-DEFORMATION OF NANOMETER-SCALE GOLD CONNECTIVE NECKS [J].

AGRAIT, N ;

RUBIO, G ;

VIEIRA, S .

PHYSICAL REVIEW LETTERS, 1995, 74 (20) :3995-3998

[3] CONDUCTANCE STEPS AND QUANTIZATION IN ATOMIC-SIZE CONTACTS [J].

AGRAIT, N ;

RODRIGO, JG ;

VIEIRA, S .

PHYSICAL REVIEW B, 1993, 47 (18) :12345-12348

[4] DIRECT CALCULATION OF TUNNELING CURRENT [J].

CAROLI, C ;

COMBESCO.R ;

NOZIERES, P ;

SAINTJAM.D .

JOURNAL OF PHYSICS PART C SOLID STATE PHYSICS, 1971, 4 (08) :916-&

[5] EFFECTS OF M-NOT-EQUAL-0 TIP STATES IN SCANNING TUNNELING MICROSCOPY - THE EXPLANATIONS OF CORRUGATION REVERSAL [J].

CHEN, CJ .

PHYSICAL REVIEW LETTERS, 1992, 69 (11) :1656-1659

[6]

Dremov V V, 1994, PHYS LOW-DIMENS STR, V11-12, P29

[7] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J].

DURIG, U ;

GIMZEWSKI, JK ;

POHL, DW .

PHYSICAL REVIEW LETTERS, 1986, 57 (19) :2403-2406

[8] OBSERVATION OF METALLIC ADHESION USING THE SCANNING TUNNELING MICROSCOPE [J].

DURIG, U ;

ZUGER, O ;

POHL, DW .

PHYSICAL REVIEW LETTERS, 1990, 65 (03) :349-352

[9] ADSORPTION OF NOBLE-GASES ON METAL-SURFACES AND THE SCANNING TUNNELING MICROSCOPE [J].

FLORES, F ;

DEANDRES, PL ;

GARCIAVIDAL, FJ ;

JURCZYSZYN, L ;

MINGO, N ;

PEREZ, R .

PROGRESS IN SURFACE SCIENCE, 1995, 48 (1-4) :27-38

[10] TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY [J].

GIMZEWSKI, JK ;

MOLLER, R .

PHYSICAL REVIEW B, 1987, 36 (02) :1284-1287