Optical properties of La-based high-K dielectric films

被引:39
作者
Cicerrella, E
Freeouf, JL [1 ]
Edge, LF
Schlom, DG
Heeg, T
Schubert, J
Chambers, SA
机构
[1] Oregon Hlth & Sci Univ, Dept Elect & Comp Engn, Beaverton, OR 97006 USA
[2] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA
[3] Forschungszentrum Julich GmbH, Inst Schichten & Grenzflachen, ISG 1 IT, D-52425 Julich, Germany
[4] Forschungszentrum Julich GmbH, CNI, D-52425 Julich, Germany
[5] Pacific NW Natl Lab, Fundamental Sci Directorate, Richland, WA 99352 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2005年 / 23卷 / 06期
基金
美国国家科学基金会;
关键词
D O I
10.1116/1.2056555
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have characterized thin films of LaScO3 and LaAlO3 which were grown by molecular beam deposition on Si substrates. Samples of LaScO3 were also grown by pulsed laser deposition on MgO substrates. Using transmission studies between 1.5 and 6 eV, we have established that low temperature deposition leads to a reduced band gap with respect to the bulk crystal. Furthermore, using spectroscopic ellipsometry from 5 to 9 eV we observe substantial differences in near-band gap absorption between thin and thicker films for both materials. We obtain a band gap of 5.84 eV for the thinner film of LaAlO3, whereas we find a band gap of 6.33 eV for the thicker film of LaAlO3. Similarly we find band gaps of 5.5 and 5.96 eV, respectively, for thin and thick films of LaScO3. (c) 2005 American Vacuum Society.
引用
收藏
页码:1676 / 1680
页数:5
相关论文
共 34 条
[1]   UNAMBIGUOUS DETERMINATION OF THICKNESS AND DIELECTRIC FUNCTION OF THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY [J].
ARWIN, H ;
ASPNES, DE .
THIN SOLID FILMS, 1984, 113 (02) :101-113
[2]   DIELECTRIC-PROPERTIES OF HEAVILY DOPED CRYSTALLINE AND AMORPHOUS-SILICON FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA ;
KINSBRON, E .
PHYSICAL REVIEW B, 1984, 29 (02) :768-779
[3]   OPTICAL-PROPERTIES OF ALXGA1-XAS [J].
ASPNES, DE ;
KELSO, SM ;
LOGAN, RA ;
BHAT, R .
JOURNAL OF APPLIED PHYSICS, 1986, 60 (02) :754-767
[4]   DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].
ASPNES, DE ;
STUDNA, AA .
PHYSICAL REVIEW B, 1983, 27 (02) :985-1009
[5]   Alternate gate oxides for silicon MOSFETs using high-K dielectrics [J].
Billman, CA ;
Tan, PH ;
Hubbard, KJ ;
Schlom, DG .
ULTRATHIN SIO2 AND HIGH-K MATERIALS FOR ULSI GATE DIELECTRICS, 1999, 567 :409-414
[6]  
BOHER P, 2004, THIN SOLID FILMS, V798, P455
[7]   Epitaxial BaTiO3 thin films on MgO [J].
Buchal, C ;
Beckers, L ;
Eckau, A ;
Schubert, J ;
Zander, W .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1998, 56 (2-3) :234-238
[8]  
BUCHANAN DA, 1996, S PHYS CHEM SIO2 INT
[9]   Spectroscopic ellipsometry characterization of high-k dielectric HfO2 thin films and the high-temperature annealing effects on their optical properties [J].
Cho, YJ ;
Nguyen, NV ;
Richter, CA ;
Ehrstein, JR ;
Lee, BH ;
Lee, JC .
APPLIED PHYSICS LETTERS, 2002, 80 (07) :1249-1251
[10]   Measurement of the band offsets between amorphous LaAlO3 and silicon [J].
Edge, LF ;
Schlom, DG ;
Chambers, SA ;
Cicerrella, E ;
Freeouf, JL ;
Holländer, B ;
Schubert, J .
APPLIED PHYSICS LETTERS, 2004, 84 (05) :726-728