Vibrational study of C-60 overlayers on H/Si(111)-(1x1)

被引:32
作者
Dumas, P
Gruyters, M
Rudolf, P
He, LM
Yu, LM
Gensterblum, G
Caudano, R
Chabal, YJ
机构
[1] LASIR, F-94320 THIAIS, FRANCE
[2] FAC UNIV NOTRE DAME PAIX, LISE, B-5000 NAMUR, BELGIUM
[3] AT&T BELL LABS, LUCENT TECHNOL, MURRAY HILL, NJ 07974 USA
关键词
electron energy loss spectroscopy; fullerenes; infrared absorption spectroscopy; silicon; vibrations of adsorbed molecules;
D O I
10.1016/S0039-6028(97)80028-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have studied the vibrational properties of thin C-60 overlayers deposited on ideally H-terminated Si(111) surfaces, by multiple infrared reflection and high-resolution electron energy-loss spectroscopies. We find that the Si-H interface remains intact upon C60 deposition: the Si-H stretching mode frequency, initially at 2083.8 cm(-1), shifts downward to 2062 cm(-1), and broadens while keeping the same integrated intensity. Due to the symmetry-breaking effect at the surface on the adsorbed C60 molecules, a new IR band is observed at 1445 cm(-1) which is mainly s-polarised. No evidence for chemical interaction between C60 and H/Si(111)-(1 x 1) is found, pointing to van der Waals-type bonding. From the relative intensities of the dipole-active and -inactive modes in HREELS in the specular direction, and from the angular width of the scattered elastic peak, the growth of an ordered film is inferred.
引用
收藏
页码:330 / 336
页数:7
相关论文
共 37 条
[21]   SOLID C-60 - A NEW FORM OF CARBON [J].
KRATSCHMER, W ;
LAMB, LD ;
FOSTIROPOULOS, K ;
HUFFMAN, DR .
NATURE, 1990, 347 (6291) :354-358
[22]   C-60 - BUCKMINSTERFULLERENE [J].
KROTO, HW ;
HEATH, JR ;
OBRIEN, SC ;
CURL, RF ;
SMALLEY, RE .
NATURE, 1985, 318 (6042) :162-163
[23]   RAMAN-SCATTERING IN C-60 FULLERENES AND FULLERIDES [J].
KUZMANY, H ;
MATUS, M ;
BURGER, B ;
WINTER, J .
ADVANCED MATERIALS, 1994, 6 (10) :731-745
[24]   INFRARED-SPECTROSCOPY OF FULLERENES [J].
KUZMANY, H ;
WINKLER, R ;
PICHLER, T .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1995, 7 (33) :6601-6624
[25]   ADSORPTION OF INDIVIDUAL C-60 MOLECULES ON SI(111) [J].
LI, YZ ;
CHANDER, M ;
PATRIN, JC ;
WEAVER, JH ;
CHIBANTE, LPF ;
SMALLEY, RE .
PHYSICAL REVIEW B, 1992, 45 (23) :13837-13840
[26]   CHARACTERIZATION OF INSULATORS BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY - APPLICATION OF A SURFACE-POTENTIAL STABILIZATION TECHNIQUE [J].
LIEHR, M ;
THIRY, PA ;
PIREAUX, JJ ;
CAUDANO, R .
PHYSICAL REVIEW B, 1986, 33 (08) :5682-5697
[27]   ELECTRON-ENERGY LOSS SPECTROSCOPY OF C-60 FULLERITE FILMS [J].
LUCAS, AA .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1992, 53 (11) :1415-1426
[28]   VIBRATIONAL STUDY OF C-13-ENRICHED C-60 CRYSTALS [J].
MARTIN, MC ;
FABIAN, J ;
GODARD, J ;
BERNIER, P ;
LAMBERT, JM ;
MIHALY, L .
PHYSICAL REVIEW B, 1995, 51 (05) :2844-2847
[29]   PHOTOEMISSION, AUTOIONIZATION, AND X-RAY-ABSORPTION SPECTROSCOPY OF ULTRATHIN-FILM C60 ON AU(110) [J].
MAXWELL, AJ ;
BRUHWILER, PA ;
NILSSON, A ;
MARTENSSON, N ;
RUDOLF, P .
PHYSICAL REVIEW B, 1994, 49 (15) :10717-10725
[30]   DETERMINATION OF CHARGE STATES OF C-60 ADSORBED ON METAL-SURFACES [J].
MODESTI, S ;
CERASARI, S ;
RUDOLF, P .
PHYSICAL REVIEW LETTERS, 1993, 71 (15) :2469-2472