Effect of top electrode on resistance switching of (Pr, Ca)MnO3 thin films

被引：35

作者：

Kim, Chang Jung ^{[1
]}

Chen, I-Wei

机构：

[1] Korea Inst Ceram Engn & Technol, Adv Mat & Components Lab, Seoul 2335, South Korea

[2] Univ Penn, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA

来源：

THIN SOLID FILMS | 2006年 / 515卷 / 04期

关键词：

electrical properties and measurements; resistivity; interfaces; metal oxide; work function;

D O I：

10.1016/j.tsf.2006.03.031

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated the relationship between top electrode materials and Pr1-xCaMnO3 (PCMO) thin films on the electric field driven resistance switching property. We used Al, Pt, Au/Cr and Au (10 mol%)-Pd (90 mol%) alloy metals as the top electrodes on PCMO films with a Pt bottom electrode to investigate the top electrode effect. The thin films with an Al and Au/Cr top electrode exhibited the electric field driven resistance switching phenomenon. The Al/PCMO film showed non-linear current-voltage characteristics with a large hysteresis. On the contrary, the thin films with Pt and Au-Pd alloy top electrode exhibited linear current-voltage characteristics without hysteresis. We found the resistance of the electrode/PCMO film is dominated by interface resistance, and switching is an interfacial phenomenon with characteristic non-linear current-voltage responses under both static and dynamic conditions. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：2726 / 2729

页数：4

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