Electronic and chemical properties of molybdenum oxide doped hole injection layers in organic light emitting diodes

被引:45
作者
Wu, Chih-I [1 ,2 ]
Lin, Chang-Ting [1 ,2 ]
Lee, Guan-Ru [1 ,2 ]
Cho, Ting-Yi [3 ]
Wu, Chung-Chih [3 ]
Pi, Tun-Wen [4 ]
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10617, Taiwan
[2] Natl Taiwan Univ, Grad Inst Photon & Optoelect, Taipei 10617, Taiwan
[3] Natl Taiwan Univ, Grad Inst Elect Engn, Taipei 10617, Taiwan
[4] Natl Synchrotron Radiat Res Ctr, Hsinchu 300, Taiwan
关键词
carrier density; molybdenum compounds; organic light emitting diodes; organic semiconductors; semiconductor thin films; ultraviolet photoelectron spectra; X-ray photoelectron spectra; MOO3;
D O I
10.1063/1.3077170
中图分类号
O59 [应用物理学];
学科分类号
摘要
The origins of barrier lowering leading to high efficient organic light emitting devices with incorporation of molybdenum oxide (MoOx) in anode structures are investigated. Ultraviolet and x-ray photoemission spectra reveal that p-type doping effects in the organic films and carrier concentration increase at the anode interfaces cause the hole injection barrier lowering. The gap states, which help carrier injection from the anodes, resulted from the oxygen deficiency in MoOx due to the interaction of organic materials and MoOx.
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页数:4
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