Multi-electron capture and emission in low energy highly charged ion-C60 collisions

被引:21
作者
Chen, L [1 ]
Bernard, J [1 ]
Denis, A [1 ]
Martin, S [1 ]
Désesquelles, J [1 ]
机构
[1] Univ Lyon 1, Spectrometrie Ion & Mol Lab, F-69622 Villeurbanne, France
来源
PHYSICA SCRIPTA | 1999年 / T80A卷
关键词
D O I
10.1238/Physica.Topical.080a00052
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In low energy highly charged ion-C-60 collisions, a great number of weakly bound electrons can be transferred to the projectile ion, creating excited highly charged C-60 and free Rydberg hollow atoms by multi-electron captures. By coincidence measurement of the number of stabilized electrons on the projectile, the multiplicity of ejected electrons and the time of flight of charged C-60 or fragments, we have studied collisionnal mechanisms for Ar8+, O8+ and Xe30+-C-60 systems. Different electron multiplicity distributions and scattered projectile kinetic energies have been observed for peripheral and frontal collisions. The number of electrons ejected during the collision depends not only on the initial charge state but also on the atomic structure of the incoming projectile ion. In the case of Xe30+ - C-60, UP to 80 active electrons have been measured even in peripheral collisions.
引用
收藏
页码:52 / 60
页数:9
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