Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes

被引：963

作者：

Meyer, Jannik C. ^{[1
,2
]}

Kisielowski, C. ^{[3
]}

Erni, R. ^{[3
]}

Rossell, Marta D. ^{[3
]}

Crommie, M. F. ^{[1
,2
]}

Zettl, A. ^{[1
,2
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

NANO LETTERS | 2008年 / 8卷 / 11期

关键词：

D O I：

10.1021/nl801386m

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We present a transmission electron microscopy investigation of graphene membranes, crystalline foils with a thickness of only I atom. By using aberration-correction in combination with a monochromator, 1-angstrom resolution is achieved at an acceleration voltage of only 80 kV. The low voltage is crucial for the stability of these membranes. As a result, every individual carbon atom in the field of view is detected and resolved. We observe a highly crystalline lattice along with occasional point defects. The formation and annealing of Stone-Wales defects is observed in situ. Multiple five- and seven-membered rings appear exclusively in combinations that avoid dislocations and disclinations, in contrast to previous observations on highly curved (tube- or fullerene-like) graphene surfaces.

引用

页码：3582 / 3586

页数：5

共 28 条

[1] Irradiation effects in carbon nanostructures [J].

Banhart, F .

REPORTS ON PROGRESS IN PHYSICS, 1999, 62 (08) :1181-1221

[2] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].

DOYLE, PA ;

TURNER, PS .

ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&

[3] Raman spectrum of graphene and graphene layers [J].

Ferrari, A. C. ;

Meyer, J. C. ;

Scardaci, V. ;

Casiraghi, C. ;

Lazzeri, M. ;

Mauri, F. ;

Piscanec, S. ;

Jiang, D. ;

Novoselov, K. S. ;

Roth, S. ;

Geim, A. K. .

PHYSICAL REVIEW LETTERS, 2006, 97 (18)

[4] Direct evidence for atomic defects in graphene layers [J].

Hashimoto, A ;

Suenaga, K ;

Gloter, A ;

Urita, K ;

Iijima, S .

NATURE, 2004, 430 (7002) :870-873

[5] Bipolar supercurrent in graphene [J].

Heersche, Hubert B. ;

Jarillo-Herrero, Pablo ;

Oostinga, Jeroen B. ;

Vandersypen, Lieven M. K. ;

Morpurgo, Alberto F. .

NATURE, 2007, 446 (7131) :56-59

[6] Hunting the Stobbs factor [J].

Howie, A .

ULTRAMICROSCOPY, 2004, 98 (2-4) :73-79

[7] QUANTITATIVE COMPARISON OF HIGH-RESOLUTION TEM IMAGES WITH IMAGE SIMULATIONS [J].

HYTCH, MJ ;

STOBBS, WM .

ULTRAMICROSCOPY, 1994, 53 (03) :191-203

[8] High-resolution transmission electron microscopy using negative spherical aberration [J].

Jia, CL ;

Lentzen, M ;

Urban, K .

MICROSCOPY AND MICROANALYSIS, 2004, 10 (02) :174-184

[9] Atomic-resolution imaging of oxygen in perovskite ceramics [J].

Jia, CL ;

Lentzen, M ;

Urban, K .

SCIENCE, 2003, 299 (5608) :870-873

[10] Dynamics of fullerene coalescence [J].

Kim, YH ;

Lee, IH ;

Chang, KJ ;

Lee, S .

PHYSICAL REVIEW LETTERS, 2003, 90 (06) :4

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