Impact of polymer film thickness and cavity size on polymer flow during embossing: toward process design rules for nanoimprint lithography

被引:169
作者
Rowland, HD
Sun, AC
Schunk, PR
King, WP [1 ]
机构
[1] Georgia Inst Technol, Woodruff Sch Mech Engn, Atlanta, GA 30329 USA
[2] Sandia Natl Labs, Multiphase Transport Proc, Albuquerque, NM 87185 USA
关键词
D O I
10.1088/0960-1317/15/12/025
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents continuum simulations of polymer flow during nanoimprint lithography (NIL). The simulations capture the underlying physics of polymer flow from the nanometer to millimeter length scale and examine geometry and thermophysical process quantities affecting cavity filling. Variations in embossing tool geometry and polymer film thickness during viscous flow distinguish different flow driving mechanisms. Three parameters can predict polymer deformation mode: cavity width to polymer thickness ratio, polymer supply ratio and capillary number. The ratio of cavity width to initial polymer film thickness determines vertically or laterally dominant deformation. The ratio of indenter width to residual film thickness measures polymer supply beneath the indenter which determines Stokes or squeeze flow. The local geometry ratios can predict a fill time based on laminar flow between plates, Stokes flow, or squeeze flow. A characteristic NIL capillary number based on geometry-dependent fill time distinguishes between capillary- or viscous-driven flows. The three parameters predict filling modes observed in published studies of NIL deformation over nanometer to millimeter length scales. The work seeks to establish process design rules for NIL and to provide tools for the rational design of NIL master templates, resist polymers and process parameters.
引用
收藏
页码:2414 / 2425
页数:12
相关论文
共 25 条
[1]   Fabrication of 5 nm linewidth and 14 nm pitch features by nanoimprint lithography [J].
Austin, MD ;
Ge, HX ;
Wu, W ;
Li, MT ;
Yu, ZN ;
Wasserman, D ;
Lyon, SA ;
Chou, SY .
APPLIED PHYSICS LETTERS, 2004, 84 (26) :5299-5301
[2]   Imprint lithography with sub-10 nm feature size and high throughput [J].
Chou, SY ;
Krauss, PR .
MICROELECTRONIC ENGINEERING, 1997, 35 (1-4) :237-240
[3]   Influence of elastic strains on the mask ratio in glassy polymer nanoimprint [J].
Cross, GLW ;
O'Connell, BS ;
Pethica, JB .
APPLIED PHYSICS LETTERS, 2005, 86 (08) :1-3
[4]  
CROSS GLW, 2004, MAT RES SOC S P, V841
[5]  
DEEN WM, 1998, TOPICS CHEM ENG, P597
[6]  
Fox R.W., 1998, INTRO FLUID MECH, P762
[7]   Viscoelastic properties of narrow-distribution poly(methyl methacrylates) [J].
Fuchs, K ;
Friedrich, C ;
Weese, J .
MACROMOLECULES, 1996, 29 (18) :5893-5901
[8]  
Haagh GAAV, 1998, INT J NUMER METH FL, V28, P1355, DOI 10.1002/(SICI)1097-0363(19981215)28:9<1355::AID-FLD770>3.0.CO
[9]  
2-C
[10]   Flow behaviour of thin polymer films used for hot embossing lithography [J].
Heyderman, LJ ;
Schift, H ;
David, C ;
Gobrecht, J ;
Schweizer, T .
MICROELECTRONIC ENGINEERING, 2000, 54 (3-4) :229-245