Optical anisotropy of porphyrin Langmuir-Blodgett films

被引:24
作者
Goletti, C
Paolesse, R
Di Natale, C
Bussetti, G
Chiaradia, P
Froiio, A
Valli, L
D'Amico, A
机构
[1] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy
[2] Univ Roma Tor Vergata, Unita INFM, I-00133 Rome, Italy
[3] Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, I-00133 Rome, Italy
[4] Univ Roma Tor Vergata, Dipartimento Ingn Elettr, I-00133 Rome, Italy
[5] Univ Lecce, Dipartimento Ingn Innovaz, I-73100 Lecce, Italy
关键词
reflection spectroscopy; light scattering; surface electronic phenomena (work function; surface potential; surface states; etc.); aromatics; semiconducting films;
D O I
10.1016/S0039-6028(01)01958-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Langmuir-Blodgett (LB) films of 5,10,15,20-tetrakis-[4-(1-Heptyloxy)phenyl]porphyrin (H2THOPP) have been deposited onto quartz and silver substrates. The deposited layers (20 monolayers thick) have been characterised by reflectance anisotropy spectroscopy, a technique that recently has been successfully used to study the optical anisotropies of organic materials, For porphyrin LB films, the experimental results show that a large anisotropy signal is measured in the Soret band energy region. We show that this anisotropy is clearly connected to the derivative of the dielectric function of the layer. We propose an interpretation of the derivative-like line shape as due to either strain or similar perturbations on the otherwise symmetric top-layer molecules induced by the lower-lying tilted molecules aligned along a direction related to the growth. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:31 / 36
页数:6
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